ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.
ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL.
Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.
Status: WithdrawnPublication date: 2011-11
Edition: 1Number of pages: 17
Technical Committee: ISO/TC 229 Nanotechnologies
- ICS :
- 07.120 Nanotechnologies
ISO/TS 11888:2011Stage: 95.99
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